Oxford Instruments has introduced a new tool for coating thickness measurement and materials analysis. This new model, the MAXXI 6, is based on X-ray fluorescence technology. It encompasses a high resolution silicon drift detector (SDD), measuring thinnest coatings down to the nanoscale and element composition at trace level to ensure high quality control for up to date industrial standards. The MAXXI 6 is made in Taunusstein, Germany and approved by the PTB (Physikalisch Technische Bundesanstalt) for the highest level of radiation safety.

Scope of application

Coating thickness measurement based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique, offering easy to use, fast and non-destructive analysis requiring little to no sample preparation.

The MAXXI 6 is capable of analysing solids or liquids over a wide element range from Al13 to U92. In combination with a high resolution SDD its aforementioned ability to measure thinnest coatings down to the nanoscale and element composition at trace level helps meet requirements for many industries, e.g., in the plating industry and for printed circuit board production.

Eight exchangeable collimators enable complete application coverage and the SDD offers optimal efficiency at all energy levels with an energy resolution of up to 140eV. With an unlimited selection of elements and layer structures for thickness and composition analysis, the MAXXI 6 ensures consistent high production quality in the sector of metal finishing, electronics, compliance testing, metal alloys and alternative energy.

Olaf Neuhausen, Managing Director of Oxford Instruments Roentgenanalytik GmbH, said: "Our goal was to develop a high-end coating thickness analyser without compromising on the ease of use. The MAXXI 6 offers a combination of features which, to date, has not been available in the market."