Oxford Instruments has launched a new, faster handheld XRF analyser for high performance measurement - the X-MET7000 eXpress. The new X-MET7000 eXpress delivers the high performance that is needed when measuring trace elements without compromising on time.

The new X-MET7000 eXpress delivers accurate analysis, lower limits of detection, improved precision (repeatability) and faster analysis time. With one pull of the trigger, the X-MET7000 eXpress analyses, verifies and screens materials up to 4 times faster than the X-MET7000 QuickSort. This can be critical when dealing with large volumes of samples to analyse in limited time, as in the scrap and PMI markets, and in the environmental testing industry, saving costs and increasing productivity.

The X-MET7000 eXpress includes Oxford Instruments' 40 kV X-ray tube and high resolution, high count rate Silicon-drift detector (SDD).

The X-MET7000 Series comes with the largest alloy grades library available on the handheld XRF markets, providing more than 1,600 grades to ensure accurate identification of metals.

As part of the X-MET7000 Series, the X-MET7000 eXpress offers the largest touch screen available on the market with its intuitive and easy-to-read graphical user interface. Large functional icons make learning how to use the instrument simple and quick. The bright and high contrast 4.3" Blanview? transmissive LCD touch screen ensures optimal outdoor viewing, even in direct sunlight. Its ease of use guarantees maximum productivity. Up to 10-12 hours battery life enables operation for a full working day on a single battery charge.

The handheld X-ray Fluorescence (XRF) analysers come with unsurpassed reporting flexibility; reports can be downloaded on a USB memory stick, or to a laptop using a USB connection or WiFi. The results screen and reports can be easily customised, e.g. to show pass/fail messages. The rugged, yet light and compact design of the X-MET7000 Series withstands the harshest environments and weather conditions.