Surface Roughness & Contour Measuring Systems, Surfcom NEX 2020

  • Resolution – 0.8 nanometres (50 mm stylus)
  • X axis straightness accuracy – 0.15 µm at 100 mm measuring path
  • X-axis measuring accuracy – 2.0 µm over 100 mm
  • Z axis (detector accuracy) – (1.0 + [2H]/100) µm
  • Detector sensing – LVDT + optical glass scale
  • Speed – 0.02 mm/s to 60 mm/s

  • Quickly and precisely measures contours and roughness in one measuring run
  • Linear motor drive ensures high accuracy with very high speed movement without any vibrations

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