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Mini Ate Systems
Mini Ate Systems
Qmax Test Equipments offers Mini ATE Systems, V200. This is a cost effective system designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and the challenges in testing them offline. It can provide complete PCB test and diagnostic functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP, FBGA VLSI chips, etc. It is a combinational - mixed signal test system with the addition of boundary scan test for latest generation of chips. It has card edge functional test for both digital and analogue, in circuit functional test for localised test of individual devices including LSI/ VLSI/ memory and microprocessors. It also incorporates an advanced QSM VI with user definable wave pattern. Features of V200 hardware: combinational tester with digital/ analogue and mixed signal test capabilities through simple clips and probes or through card edge or as a cluster tester with a special test fixture for up to 96 test pins. In addition it has the boundary scan test option for virtual test where the number of virtual test pin has no physical limit. Its basic timing unit is 100 ns and thus can generate test patterns at 10 MHz data rate. The timing units are programmable in 2000 steps from 100 ns to 200 µs, (100 ns, 200 ns, 300 ns, etc., up to 200 µs) thus allowing accurate pattern timings. It has 8K x 4 RAM behind each digital pin electronics and 8K x 24 RAM behind every analogue channel. Its advanced sequencer allows external event synchronisation or handshake, which are very essential in complex microprocessor tests. Unique features: programmable time base in 2000 steps; virtual RAM for unlimited test vector depth; VHDL based test; PythonTD test language; card edge functional test; guided Probe back-tracking; fault simulation; fault dictionary; user defined analogue stimulus QSM VI; and integrated boundary scan controller.
