Schedule a Call Back
Materials Analysis with X-Ray Fluorescence
Materials Analysis with X-Ray Fluorescence
Fischer Measurement Technologies offers a spectrometer for coating thickness measurement and materials analysis. This universally employable X-ray spectrometer combines the advantages of a semiconductor detector and the superior performance of a programmable XY(Z) measuring stage. It is suitable for all fields of application in particular for RoHS/WEEE and precious metal analysis. Measurement method: energy dispersive X-ray fluorescence (EDXRF) according to DIN EN ISO 3497 and ASTM B 568.
- Quantitative analysis of solid, powder or paste-like materials as well as liquids from AI (Z=13) to U (Z=92)
- Thickness and element composition measurements of individual layers in coating systems with up to 24 different elements (max. 24 individual layers)
- Substrate material analysis even through coating systems
- Programmed measurements of several samples or scanning of larger specimens
- X-ray tube with an adjustable high voltage ? 10 kV, 30 kV, 50 kV
- Semiconductor detector with Peltier cooling (-30?C)
- Energy resolution 200 eV
- Large measurement chamber with the internal dimensions W 460 x D 500 x H 140 mm
- High-precision, programmable XY stage with maximum travel distances X 256 mm and Y 235 mm
- In Z-direction, programmable motor-driven detector unit with a 140 mm travel distance
- Optimum measurement spot size through collimator set with diameters ranging from 0.1 mm to 0.6 mm
- Three motor-driven primary filter positions ? none, AI, Ni
- Video microscope with up to 180x magnification
- Software WinFTM V.6 for materials analysis and coating thickness measurement
- Top to bottom measurement direction
