Electronic Speckle Pattern Interferometer (ESPI)

• Dymek Asia Singapore Pte Limited
• Singapore

Electronic Speckle Pattern Interferometer (ESPI)

The SpeckleCam Electronic Speckle Pattern Interferometer (ESPI) measures the change in shape of structures with diffuse surfaces. Its patented, single camera pixelated sensor enables high spatial sampling. Rapid data acquisition permits accurate testing and quality control on the production floor, without the need for costly vibration isolation hardware. With the ESPI, a baseline measurement is made, then subsequent measurements are compared to it, to determine deformation. Measurements can be made synchronously or asynchronously with respect to object motion. For measurement of vibrational deformation, synchronous capture can examine changes over a wide frequency and phase spectrum.