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Depth Measuring Microscope, Non Contact
Depth Measuring Microscope, Non Contact
SDM Sipcon, a non contact depth measuring trinocular microscope is specially designed for very accurate and precision measurement of the components with three-axis DRO system, ie, X, Y and Z axis. This supports a vast field of applications like measurement of strain of lead frame, measurement of wafer bump height, measurement of height of solder, measurement of steps on hybrid IC, measurement of depth of metallic mould, etc. The microscope is equipped with high resolution optics and wide field eyepiece (mag 40X to 1500X) for accurate and precise focusing of the component to achieve the desired accuracy particularly for measurements of depth, etc. All the mechanical parts, ie, coarse an fine motion, and also the workstage is designed on frictionless ball bearing guides for smooth and accurate movement. The microscope has built-in halogen illuminator for surface and base illumination controlled through intensity control with high-grade condenser system to provide brilliant illumination. It is supplied with high transmission binocular/trinocular head with multi layer coated prisms to provide optimum contrast and an excellent image quality for microphotography and CCTV observations.