JTAG Technologies, a market leader and technology innovator of boundary-scan software and hardware products and services, will be showcasing latest developments and products at Autotestcon Anaheim (USA) in September this year. Amongst a variety of military and aerospace products, these latest models deserve attention and will be presented at Autotestcon:

The new JTS1000 is a Universal JTAG Boundary Scan Tester and Programmer developed in partnership with Astronics Corp that can be utilized as a Production Run Time and Application Development system for performing Circuit Card Assembly (CCA) structural integrity tests or CCA programming. The available assets packaged within a small footprint make the JTS1000 suitable for both Production and Field Testing. The JTS1000 utilizes Astronics DME's Test EZ? Software Suite for automated testing and program development. Astronics Corporation is a leader in advanced, high performance lighting, electrical power and automated test systems for the global aerospace and defense industries.

Another product is the recently introduced high-level JTAG access routines, which can be linked into the Python freeware open-source language. Called JTAG Functional Test (JFT) routines, they work at two levels (or perspectives), namely: boundary-scan pin-level and 'cluster' pin-level.

In the boundary-scan pin-level example users can set-up tests with minimal knowledge of the interconnections and without reference to a design netlist. Individual pins can be driven using DriveHigh, DriveLow and HighZ and individual pins can be read using TestHigh and TestLow .

Also, groups of pins can be defined by DeclareGroup. For example, the pins of a JTAG-compliant device which connect to a (non-JTAG-compliant) DAC might be grouped and named 'DAC-input'. The variable 'DAC-input' can then be controlled using a DriveVar command. Similarly, the output of an ADC could be suitably-named and read by a TestVar routine.

JTAG Technologies was the first to bring to the market such important advances as automated test generation, automated flash and PLD programming via boundary-scan, and visualized boundary-scan analysis. Its customers include world leaders in electronics design and manufacturing such as Alcatel-Lucent, Ericsson, Flextronics, Honeywell, Medtronic, Motorola, Nokia, Philips, Raytheon, Rockwell-Collins, Samsung, and Sony. The company serves the communications, medical electronics, avionics, defense, automotive, and consumer industries with offices throughout North America, Europe and Asia.

iNETest Technologies India Pvt Ltd, Chennai. Tel: 044-26400779, 26610171. Email: jtag@inetest.co.in