• Jenoptik India Private Limited

Roughness & Contour Measuring System

Jenoptik India Private Limited offers a stationary Roughness and Contour Measuring System, Model Hommel-Etamic Nanoscan 855. Tactile workpiece scanning is transmitted to an optical scale by a high-precision mechanical pick-up, which is then interpreted by a laser interferometer. This innovative design makes the Nanoscan 855 the measuring system of choice for high precision applications. Roughness and contour parameters with the lowest tolerances are to be determined on the valve element and on various anchor parts. Pt, angles, radii and edges are evaluated. All roughness and contour parameters are measured with one probe arm in one action. The measurement is taken using a Hommel Nanoscan measuring station with high-resolution axes. The extremely high resolution combined with the large measurement range enables roughness and contours to be determined in one action. A specially matched air damping system and an enclosure, which minimises external influences on the measurement process, meets these stringent requirements for accuracy. The workpieces are mounted onto a CNC-controlled X-Y table. Fixtures and probe arms are automatically detected and the appropriate CNC processes are loaded. This minimises operator intervention and eliminates the possibility of operating errors.