Pc Based Stress Analyser

Pc Based Stress Analyser


Latest model of Stress Analyser from TEC of USA is suitable for metals and ceramics, which measures residual austenite (even lower than IO%) in steels as well. It is based on X-ray diffrac-tion principle. Being portable, it can be used anywhere in the lab, workshop or field. It is flexible and can be adapted easily and quickly on any shape, size, configuration and is interlaced with computer for fast data acquisition, and analysis. The print-ed result can be had in 5-1 0 minutes. TEC's analyser is not a huge and complicated system needing deep knowledge of X-ray diffraction and computer working. User areas include: aeronaut-ics, space, automobile, tractor, ordnance, and heavy machine industries, research centres, and engineering institutes.

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