Image analysis system, material science

Image analysis system, material science


Metatech offers complete image analysis system for material science applications with maximum utilization of the existing hardware like microscope, computer, CCD camera, etc. The dedicated software offers percentage phase estimation (six phases simultaneously), grain size estimation as per ASTME 112, nodularity analysis, thickness measurement of plating, coating , decarburisation, interlamellar distance, interdendritic arm spacing, particle size/shape/distribution, Vickers hardness measurements, effective case depth curve and other dedicated parameters. It can also perform non metallic inclusion counting as per ASTME 45, DIN 50601, JIS G 555, where sample preparation is absolute conducive to perform the subject analysis. The company offers unique combination of software back up along with metallography critical applications" expertise to cater to critical needs of image applications.

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