In-Process Surface Roughness Measurement, 4964077

In-Process Surface Roughness Measurement, 4964077


An optical roughness measurement device which fulfills the special requirements of in-process surface roughness determination has been developed at the Institute of Measurement Control and Systems Engineering of the University of Bremen. The principle is based on the analysis of a single CCD-shot of a polychromatic speckle pattern produced by laser light scattered from a rough surface. Image processing algorithms using autocorrelation techniques determine an optical roughness parameter which shows a good correlation to the parameter defined in DIN 4762.

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