• Stresstech Bharat Private Limited

X-Ray Stress Analyser

Stresstech Bharat Pvt Ltd offers an X-Ray Stress Analyser, Xstress 3000 G2/G2R. X-ray diffraction is the conventional and time proven technique for measuring residual stresses. Using the interatomic spacing as the ultimate gage length, the X-ray technique is ideal for and applicable to all crystalline materials, especially for metals, but also for ceramics. It measures the absolute stress without the need for an unstressed sample for calibration. Xstress 3000 G2/G2R represents advances in design and construction, which provide enhanced reliability and function in the first truly portable X-ray stress analyser. As an easily portable instrument Xstress 3000 G2/G2R is suitable for measurements in the laboratory as well as in the field. It is set up in less than 10 minutes needing no special tools. Aligning before measurements is fast and easy – measurements can be made by only one person. Xstress 3000 G2/G2R can be operated in any position. There are no limits for sample size, neither is there need for sample cutting. The instrument has only one software that takes care of the user interface, numerical analyses and machine control. This software is easy to update for optional features. Residual stress and retained austenite measurements can be made in every direction. Thanks to patented semiconductor detectors measurement time is on typical steel sample two minutes or less. The distance between goniometer and measurement point is automatically adjusted. Xstress 3000 G2/G2R includes versatile in-built safety features. Optionally it can be equipped with safety cabinet with fail-safe interlocking door switch. A special table for electropolishing makes measuring stress profiles easy and convenient to do. With a floor stand measurements can be made on parts or surfaces on which the standard tripod is hard to attach.